Agilent Technologies Inc. announced that its recently introduced test and inspection innovations have won several industry awards at two major tradeshows in April:
The Agilent Medalist x6000 Automated X-ray Inspection solution won the SMT China magazine’s 2nd SMT China VISION award for Inspection and Testing (AXI category) at Nepcon Shanghai 2008. Earlier this year, the Medalist x6000 won an honorable mention from Test and Measurement World magazine for its 2008 Best in Test awards.
Agilent’s Network Parameter Measurement technology, part of the Medalist VTEP v2.0 Powered vectorless test suite, won the Electronic Manufacturing (EM) Asia Innovation award in the Test System/Equipment category, also at Nepcon Shanghai 2008.
Agilent’s Cover-Extend technology, the latest limited-access solution to be added to the company’s VTEP 2.0 Powered suite, was selected among the winners for the IPC Innovation Technology Center award at the APEX tradeshow in Las Vegas.
The awards recognize what each of these leading industry publications and organization consider to be the most innovative technologies, applications, products and services in the market.
“We are deeply honored by the industry recognition for our innovations in the area of test and inspection,” said NK Chari, director of marketing with Agilent’s Measurement Systems Division. “Our vision is to continuously innovate and introduce the most complete suite of test and inspection solutions that will enable manufacturers to overcome their technology and business challenges.”
